We propose a method to measure light transmittance of layered metamaterials by placing the metamaterials directly on a Si photodiode. Our measurement method enables the direct detection of transmitted light that appears as an evanescent wave in natural materials. Here, we report the transmittance measurements of a typical metamaterial using this method. The metamaterial was composed of Ag / Al₂O₃ layers and was fabricated by direct evaporation on the Si photodiode. The measured transmittance agrees with the simulated transmittance. Our results confirmed that this measurement method can determine the transmittance properties of metamaterials and that it is applicable to other types of metamaterials.

References :
Akihiro Isozaki, Tetsuo Kan, Kiyoshi Matsumoto, Isao Shimoyama,“A Measurement Method for Light Transmittance of Layered Metamaterials,” The 8th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, pp. 151 - 154 , Suzhou, China, Apr. 7 - 10, 2013.

Akihiro Isozaki, Tetsuo Kan, Kiyoshi, Yoshiharu Ajiki, Matsumoto and Isao Shimoyama, “A Measurement Method for Light Transmittance of Layered Metamaterials,” Optics Letters, Optical Society of America, Vol. 38, Issue 11, pp. 1811-1813, 2013. [Paper]